Overview
More and more electronics manufacturing companies recognize that frequent electromagnetic compatibility (EMC) / electromagnetic interference (EMI) testing and rectification has become a major bottleneck in reducing product development costs and shortening product development cycles. EMI pre-compliance testing throughout the process from R&D, sample production to formal production is the most common means of breaking this bottleneck.
Although EMI pre-compliance testing has become a consensus in the electronics industry, most companies' attempts have been hampered by cost. Only a few large electronics companies have sufficient funds to build, buy anechoic chambers, standard receivers and corresponding peripherals to build a test system similar to EMC's standard laboratories. And a large number of small and medium-sized enterprises and electronics design studios are always looking for a low-cost and efficient EMI pre-compatibility test solution.
Typical EMI test system
Most electronic products require two types of EMI tests, conductive leakage and radiation leakage. The essence is to use a spectrum analyzer or receiver to measure the interference signal picked up by the measurement accessory.
Figure 1 Conducted leak test
Figure 1 is a typical conduction test instrument connection configuration
The most common device for picking up interference signals on the power line is the Linear Impedance Matching Network (LISN). The transient limiter can effectively prevent the spectrum analyzer or receiver from being damaged by the high-power transient signal generated by the LISN. The test piece, the accessory and the spectrum analyzer of the conduction test are completely connected by cables, so it is very easy to implement and is not susceptible to interference. We use a similar method for pre-compliance testing, and the results are often in good agreement with the test results from EMC certification bodies.
Figure 2 Radiation Leakage Test
Figure 2 shows the connection of a typical radiation leak test.
Radiation interference from a double-cone antenna and a log-period antenna pick-up space is typically used in an anechoic chamber or open space. The anechoic chamber is the ideal test environment to effectively eliminate the effects of environmental interference and reflection resonance. But for most companies, the investment in anechoic chambers is too high. The traditional alternative is to test in open space to reduce
Small emissions and resonance effects, but complex environmental electromagnetic wave interference is always difficult to completely eliminate.
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